Zygo Metrology Systems Support Virtual Reality Product Development
A global VR solutions provider, relies on Zygo for optimal results. Captain Lin, a key figure within the company, highlights the necessity of Zygo’s technology for intricate adjustments, ensuring unparalleled quality in headset lenses and cellphone screens.
Mechanical Design Of Optical Systems Using MSC Nastran
A common mechanical failure in optical systems is inadequate stiffness in the supporting structure. Stiffness is crucial for maintaining alignment of the optical elements and achieving adequate performance. The mechanical engineer is responsible for providing adequate stiffness in the mechanical design.
Onto Innovation Debuts Firefly G3 Panel-level Packaging Inspection System
The Firefly G3 system delivers unique inspection and metrology process control technologies aimed at buried defects and voids supporting next generations of glass and copper clad laminate (CCL).
New Direct Scanning Strategy Improves Accuracy And Repeatability
Since the launch of the Leica Absolute Tracker ATS600, the system’s ground-breaking direct scanning capability has opened a wide range of new metrology-grade inspection applications. Measurements previously unattainable are a thing of the past, enabling greater quality control over large-scale products than ever before possible.
United Grinding Laser Contour Check Revolutionises Tool Measurement
New innovative option Laser Contour Check for non-contact measurement of various tool parameters on cylindrical tools in tool grinding and eroding machines from WALTER, a member of United Grinding.
Metrology Takes Flight Through Rossell Techsys’ State-of-the-Art Calibration And Metrology Lab
Metrology takes the spotlight with Rossell Techsys, a leading global engineering and manufacturing company in the aerospace and defense sector, unveiling its new Calibration and Metrology Lab at its India facility in Devanahalli, Bangalore.
Non-Destructive Nanometer-Level Measurement Device By AUDIRA To Complement Current Metrology Techniques
To ensure accurate measurement, Nearfield Instruments B.V., a provider of process control metrology solutions for advanced semiconductor devices, launched AUDIRA – the industry’s first and only in-line, non-destructive subsurface metrology system for advanced semiconductor manufacturing.
Hexagon Accelerates Large Surface Inspection With Absolute Scanner AS1-XL
The Absolute Scanner AS1-XL brings flagship-quality scan definition for extra-large surface measurement, for both portable arm and laser tracker systems.
