Renishaw: SFP2 Surface Finish Measurement Probe

Renishaw’s SFP2, a surface finish measurement probe designed for use with the REVO 5-axis measurement system on coordinate measuring machines (CMMs), increases the REVO system’s surface finish measurement ability.

The REVO system offers a multi-sensor capability with touch trigger, high speed tactile scanning and non-contact vision measurement on a single CMM.

The surface finish system is fully integrated with the standard CMM inspection program, thanks to the automatic changing of the SFP2 probe and stylus holders using the MRS-2 rack and RCP TC-3 ports. It is managed by the same I++ DME compliant interface as the REVO system, and the MODUS metrology software provides full user functionality.